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Beam Profiler

[ Dataray ]
Beam’R2
XY Scanning Slit Beam Profiler

사양
XY Scanning Slit System, 190 to 2500* nm
Data sheet
다운로드
Manual
다운로드
모 델
S-BR2-Si
브랜드
Dataray

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
  • Port-powered USB 2.0; flexible 3 m cable; no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Economical and accurate
  • M² option – beam propagation analysis, divergence, focus