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Beam Profiler
![[ Cinogy ]<Br>Near-Field Beam Profiler](/thum_img/mjct/goods_img3/19f24bcacda8f2ef178722ef8955da93_water_4de0b559c44a49f5f544fca08f3bc282_c0_w300_h300.jpg)
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Scientific Solution - Near Field Measurement
CINOGY Technologies near field beam profiling option is suitable for focus spot measurements and near field imaging of fiber ends or output surfaces from laser diodes over a wide wavelength range. The set-up based on the compact CinCam CMOS models and can be assembled with different microscope objectives. These calibrated microscope objectives assured maximum accuracy and enables imaging of small beam structures on the diffraction limit.
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Magnification: |
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4x (calibrated) |
10x (calibrated) |
20x (calibrated) |
40x (calibrated) |
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Spectral response (+NIR / IR Option): |
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320-1150nm |
320-1150nm |
320-1150nm |
320-1150nm |
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Data output: |
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8Bit / 10Bit |
8Bit / 10Bit |
8Bit / 10Bit |
8Bit / 10Bit |
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Numerical aperture (NA): |
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0.1 |
0.25 |
0.4 |
0.65 |
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Working distance (WD): |
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15.8mm |
6.4mm |
0.8mm |
0.6mm |
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Focal length: |
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29.8mm |
17.19mm |
8.33mm |
4.03mm |
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Optical resolution: |
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~2µm |
~1.5µm |
~1.2µm |
~1.0µm |
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Accuracy: |
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Beam size <2% |
Beam size <2% |
Beam size <2% |
Beam size <2% |
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Beam profiler: |
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CinCam CMOS / CinCam CMOS Nano |
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Input power (max): |
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100mW@4x, 10x / 10mW@20x, 40x / 1320nm and 1550nm on request |
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NIR Option: Residual Silicon Response (1320nm) / IR Option: 1470-1605nm |
