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Beam Profiler
Beam Profiler
[ Dataray ]
BeamMap2
XYZΘΦ Scanning Slit Beam Profiler
Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Multiple plane spacing options available – please review this worksheet to identify the correct plane spacing for your application
- Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
